MemBIST TOOL
Principles
of RAM memory testing
and
generation of memory BIST structures
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Introduction |
The memBIST software tool automatically generates built-in self-test
blocks for a given memory matrix as a VHDL model of the whole system.
A module for visualisation of RAM memory fault models, testing algorithms
as well as memory BIST construction principles is a part
of the tool. |
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Method |
Memory
fault modeling includes four classic memory fault models: stuck-at
fault, transition fault, coupling fault and neighbourhood
pattern sensitive fault models. Special required patterns (a sequence
of ones and zeros chosen for a specific memory type) are the principle of
memory testing. At present mostly many types March like algorithms (e.g.
MATS++, March C-, March LR, March G, IFA patterns) are used in testing of
bit or word oriented memories. The solution for testing a memory embedded
into a complex SOC is using the memory BIST structure where
the whole test algorithm is implemented on chip. |
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Tool description |
memBIST
consists of two modules:
- a testing module for demonstration and exercise of
RAM memory faults and March C- testing algorithm using visualisation of
a RAM bit/word memory matrix,
- a module for synthesis of a specified built-in self-test architecture
for a given memory matrix .
Tool input: a structure of RAM memory matrix, tool
output: VHDL code of built-in self-test components (address generator,
test generator, control logic, output response compactor and analyser)
on the behavioural level. |
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Requirements |
Web
browser with Sun Java plug-in (1.3 or higher) installed.
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Select a module to start the applet :
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memBIST
Generator ©2003 - 2004 Institute of Informatics SAS
Contact: Maria Fischerova, maria.fischerova@savba.sk |
